by FASTMICRO
Frontimage of the Fastmicro Sample Scanner by FAST MICRO that validates surface cleanliness with 0.5 µm particle detection, objective reports and measurements in seconds.

Equipment Others, Optical Surface Inspection

Fastmicro Sample Scanner

Surface cleanliness validation with 0.5 µm particle detection, objective reports and fast operator workflow.

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by ONTO INNOVATION (DACH, Benelux, North France)
Onto Innovation: Image of the Defect and Contamination Inspection System PrimaScan P for up to 600x600 mm panels.

Optical Surface Inspection

PrimaScan™ P Series

All-surface contamination and defectivity inspection and imaging for wafers, reticles, and panel level substrates, ≤ 600...

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by ONTO INNOVATION (DACH, Benelux, North France)
Image of the Surface & Sub-Surface Defect Inspection Celero PL for 100-300mm wafers from Onto Innovation.

Optical Surface Inspection

Celero™ PL System

Subsurface defect inspection and classification for silicon carbide (SiC) and gallium nitride (GaN) based wafers and...

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by ONTO INNOVATION (DACH, Benelux, North France)
Image of the Defect and Contamination Inspection System PrimaScan from Onto Innovation with manual load from 100-450mm substrates.

Optical Surface Inspection

PrimaScan™ Series

All-surface contamination and defectivity inspection and imaging for wafers, reticles, and panel level substrates, 100–450 mm,...

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